- ellipsometric parameters
- еліпсометричні параметри
English-Ukrainian dictionary of microelectronics. 2013.
ellipsometric parameters
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Ellipsometry — is a versatile and powerful optical technique for the investigation of the dielectric properties (complex refractive index or dielectric function) of thin films. It has applications in many different fields, from semiconductor physics to… … Wikipedia
Fresnel equations — The Fresnel equations, deduced by Augustin Jean Fresnel (pronEng|freɪˈnɛl), describe the behaviour of light when moving between media of differing refractive indices. The reflection of light that the equations predict is known as Fresnel… … Wikipedia
